SINAPSE Virtual Happy Hour Aug 25, 2021 05:00 PM - 06:00 PM — Zoom
3rd Scottish Ultrasound Annual Scientific Meeting Aug 27, 2021 10:00 AM - 05:00 PM — Virtual Meeting (online)
Medical Imaging Convention [rescheduled] Sep 15, 2021 - Sep 16, 2021 — National Exhibition Centre, Birmingham, England
2021 SINAPSE ASM Sep 16, 2021 - Sep 17, 2021 — Technology & Innovation Centre, University of Strathclyde, 99 George Street, Glasgow
Total Body PET 2021 conference [rescheduled] Sep 22, 2021 - Sep 24, 2021 — Virtual Meeting (online)


SINAPSE experts from around Scotland have developed ten online modules designed to explain medical imaging. They are freely available and are intended for non-specialists.

Edinburgh Imaging Academy at the University of Edinburgh offers the following online programmes through a virtual learning environment:

Neuroimaging for Research MSc/Dip/Cert

Imaging MSc/Dip/Cert

PET-MR Principles & Applications Cert

Applied Medical Image Analysis Cert

Online Short Courses

Reversible exchange of self-assembled monolayers of semifluorinated n-alkanethiols and n-alkanethiols on Au/mica surfaces

Author(s): S. N. Patole, C. J. Baddeley, D. O'Hagan, N. V. Richardson

Scanning tunnelling Microscopy (STM) and photoelastic modulation infrared reflection absorption spectroscopy (PM-IRRAS) have been used to investigate the exchange of self-assembled rnonolayers (SAMs) of n-octanethiolate by semifluorinated n-octanethiolate from ethanolic solution at 340 K. The process occurs via displacement of the thiols from domain boundaries. By contrast, the reverse exchange process occurs more homogeneously via the formation of mixed thiolate domains. The ability of semifluorinated octanethiolate to adopt a range of adsorption sites with approximately similar adsorption energies may lead to this contrasting behavior.

Full version: Available here

Click the link to go to an external website with the full version of the paper

ISBN: 1932-7447
Publication Year: 2008
Periodical: Journal of Physical Chemistry C
Periodical Number: 36
Volume: 112
Pages: 13997-14000
Author Address: